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nvd-json-data-feeds/CVE-2022/CVE-2022-256xx/CVE-2022-25697.json

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{
"id": "CVE-2022-25697",
"sourceIdentifier": "product-security@qualcomm.com",
"published": "2022-12-13T16:15:18.490",
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"lastModified": "2024-11-21T06:52:45.573",
"vulnStatus": "Modified",
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"cveTags": [],
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"descriptions": [
{
"lang": "en",
"value": "Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables"
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},
{
"lang": "es",
"value": "Corrupci\u00f3n de la memoria en los buses i2c debido a una validaci\u00f3n de entrada incorrecta al leer la configuraci\u00f3n de la direcci\u00f3n del controlador i2c en Snapdragon Mobile, Snapdragon Wearables"
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}
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"source": "product-security@qualcomm.com",
"type": "Secondary",
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"cvssData": {
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"vectorString": "CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H",
"baseScore": 8.4,
"baseSeverity": "HIGH",
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"attackVector": "LOCAL",
"attackComplexity": "LOW",
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"privilegesRequired": "NONE",
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"userInteraction": "NONE",
"scope": "UNCHANGED",
"confidentialityImpact": "HIGH",
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"availabilityImpact": "HIGH"
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},
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"exploitabilityScore": 2.5,
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"impactScore": 5.9
},
{
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"source": "nvd@nist.gov",
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"vectorString": "CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H",
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"attackVector": "LOCAL",
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"privilegesRequired": "LOW",
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"userInteraction": "NONE",
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"availabilityImpact": "HIGH"
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},
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"exploitabilityScore": 1.8,
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"impactScore": 5.9
}
]
},
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"type": "Primary",
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"lang": "en",
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"value": "CWE-787"
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"tags": [
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]
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},
{
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"tags": [
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}
]
}
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